Title page for ETD etd-02242010-171153

Type of Document Master's Thesis
Author Kestell, Gayle M
URN etd-02242010-171153
Title Model of chromium poisoning in the cathode of a solid oxide fuel cell using the lattice Boltzmann method
Degree Master of Science
Department Mechanical Engineering
Advisory Committee
Advisor Name Title
von Spakovsky, Michael R. Committee Chair
Ellis, Michael W. Committee Member
Lu, P. Kathy Committee Member
Reynolds, William T. Jr. Committee Member
  • chromium poisoning
  • Kinetic Theory
  • Lattice Boltzmann Method
  • SOFC
  • Fuel Cell
Date of Defense 2010-02-12
Availability restricted
The metallic interconnect of a solid oxide fuel cell (SOFC) contains chromium in order to protect the metal from the corrosive environment in the fuel cell. Unfortunately, the chromium introduces chemical instability in the cathode as it migrates from the interconnect to the pores in the cathode. A model was developed previously in Asinari et al. [1] and Kasula et al [2] to model the flow of particles in a fuel cell electrode. To learn more about the migration of the chromium, the previous code is modified in this thesis work to include the effects of the chromium. The model uses Kinetic Theory to simulate the fuel cell at a mesoscopic scale. The discretized form of the Lattice Boltzmann equation is modified for enhanced performance and for use on a parallel processing system.

With the new model, the migration of the chromium in the cathode and the performance degradation of the fuel cell are predicted.

  Filename       Size       Approximate Download Time (Hours:Minutes:Seconds) 
 28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access 
[VT] Kestell_GM_T_2010.pdf 3.93 Mb 00:18:11 00:09:21 00:08:11 00:04:05 00:00:20
[VT] indicates that a file or directory is accessible from the Virginia Tech campus network only.

Browse All Available ETDs by ( Author | Department )

dla home
etds imagebase journals news ereserve special collections
virgnia tech home contact dla university libraries

If you have questions or technical problems, please Contact DLA.