Title page for ETD etd-03032009-040639

Type of Document Master's Thesis
Author Landron, Orlando
URN etd-03032009-040639
Title Microwave multipath resolution in microcellular channels
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Feuerstein, Martin J. Committee Co-Chair
Rappaport, Theodore S. Committee Co-Chair
Woerner, Brian D. Committee Member
  • Cellular telephones
Date of Defense 1992-08-05
Availability restricted

The objective of this research is to compare radio channel impulse response measurements with site-specific radio wave propagation prediction techniques. A wide band spread spectrum measurement system was developed, and desirable measurement locations were selected on the Virginia Tech campus. These measurements are designed togo beyond statistical characterizations of the channel and will aid in determining how the propagation environment is influencing the multi path propagation. The objective is to not only measure the delays and relative powers of multi path components, but to carefully document their angles of arrival and resolve the overall paths that these multipaths had to take to reach the receiver. This information will be used to compare with propagation prediction simulations using the modeled environment, and therefore, provide new insight into the nature of reflection and scattering of radio propagation in typical microcellular environments.

As a first step in this endeavor, building surface characterizations are made in order to determine empirical reflection coefficients of common building materials. Propagation experiments have been designed to determine applicability of Fresnel reflection formulas to non-ideal conditions, such as waves that are not perfect plane waves, rough surfaces, etc. This information allows propagation prediction techniques to further quantify the site-specific mobile radio environment and yield more accurate propagation estimates. For this endeavor, Whittemore Hall and Squires Student Center were Chosen to provide reflection measurements from rough stone, glass, and brick surfaces.

Detailed descriptions of measurement techniques, analysis and results are included.

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