Title page for ETD etd-06062008-170406

Type of Document Dissertation
Author Cho, Chang H.
URN etd-06062008-170406
Title A formal model for behavioral test generation
Degree PhD
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Armstrong, James R. Committee Chair
Brown, Ezra A. Committee Member
Gray, Festus Gail Committee Member
Ha, Dong Sam Committee Member
Tront, Joseph G. Committee Member
  • Integrated circuits
Date of Defense 1994-02-08
Availability restricted
see document
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[VT] LD5655.V856_1994.C56.pdf 5.60 Mb 00:25:54 00:13:19 00:11:39 00:05:49 00:00:29
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