Title page for ETD etd-07242012-040058

Type of Document Master's Thesis
Author Reed, Karen L.
URN etd-07242012-040058
Title The influence of meteorological events and cultural practices on sclerotinia crown and stem rot of alfalfa, caused by Sclerotinia trifoliorum.by Karen L. Reed.
Degree Master of Science
Department Plant Pathology, Physiology, and Weed Science
Advisory Committee
Advisor Name Title
Stromberg, Erik L. Committee Chair
Phipps, Patrick M. Committee Member
VanScoyoc, S. W. Committee Member
  • Alfalfa
Date of Defense 1987-01-05
Availability restricted
Sclerotinia crown and stem rot (SCSR), caused by Sclerotinia

trifoliorum Eriks., causes serious spring losses in some fall=sown,

no-tillage alfalfa fields. In microplots artificially

infested with sclerotia, greatest numbers of apothecia were found

during November and December. Temperature and rainfall had significant

impact on apothecium development. A proposed prediction

method for apothecium appearance considers monitoring mean soil

temperature. For apothecium initiation to occur, it was necessary

for sclerotia to be subjected to an estimated 17 days of

temperature at or below 15 C before apothecium production

occurred. Soil temperatures were usually below 10 C at the time

of apothecium appearance. Greatest numbers of apothecia occurred

between 5-10 C. Rainfall influenced the number of apothecia,

with significant increases occurring early in the 1984-85 production period.

  Filename       Size       Approximate Download Time (Hours:Minutes:Seconds) 
 28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access 
[VT] LD5655.V855_1987.R44.pdf 4.51 Mb 00:20:53 00:10:44 00:09:24 00:04:42 00:00:24
[BTD] next to an author's name indicates that all files or directories associated with their ETD are accessible from the Virginia Tech campus network only.

Browse All Available ETDs by ( Author | Department )

dla home
etds imagebase journals news ereserve special collections
virgnia tech home contact dla university libraries

If you have questions or technical problems, please Contact DLA.