Title page for ETD etd-02132009-172141
|Type of Document
||Fairservice, John Gordon
||The development of sampling methods for key-year patterns of white ash (Fraxinus americana L.)
||Master of Science
|Heikkenen, Herman John
|Giles, Robert H. Jr.
|Pienkowski, Robert L.
|Date of Defense
A key year is a year in which a significant number of trees had a wider or narrower growth ring than the previous year. A non-key year is a year which there vas not a
significant number of trees that had greater or less growth
than the previous year. A key-year pattern is a series of key years that are separated in time by non-key years. Keyyear
patterns have proven useful in determining the date of
construction of buildings of historical significance
A white ash key-year pattern was constructed, using 4
radii from 3 tree heights of 16 trees. Radii from a tree
height of 0.3. (1 ft) above ground were found to have
higher agree.ent with the white ash key-year pattern than
radii from positions higher in the tree. Long radii (from
off-centered piths) were found to have higher agreement than
the shorter radii. The long radii from lower heights had twice the level of agreement as the short radii at upper
heights. The amount of agreement decreased as the number of
trees used to construct the key-year pattern was dropped
from 16 to 8. At least 8 samples of lonq radii from lower
tree heights were needed to construct a key-year pattern.
At least 12 samples were needed from short radii at upper
tree heights to construct a key-year pattern. Twelve
samples were sufficient to produce a key-year pattern, when
sampling from unknown heights and radial lengths (i.e. log
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