Title page for ETD etd-05042010-145729

Type of Document Dissertation
Author Waller, LaChelle Monique
URN etd-05042010-145729
Title Transcriptional profiling of potential regulatory factors modulating defense mechanisms in soybean during Phytophthora sojae infection
Degree PhD
Department Interdisciplinary
Advisory Committee
Advisor Name Title
Tyler, Brett M. Committee Chair
Hoeschele, Ina Committee Member
Maroof, M. A. Saghai Committee Member
McDowell, John M. Committee Member
  • Transcriptional Profiling
  • Quantitative Resistance
  • Regulatory Factors
Date of Defense 2010-04-08
Availability unrestricted
Quantitative resistance is controlled by multiple genes and has been shown to be a durable form of resistance to pathogens affecting cultivated crops including soybeans (Glycine max L. Merr). Root rot of soybean caused by Phytophthora sojae ranks among the most damaging soybean diseases. Quantitative resistance has proven durable in soybean against P. sojae, however the molecular mechanisms underlying this form of resistance are still unknown. The objective of this project is to gain insight into molecular basis of quantitative resistance in the soybean-P. sojae pathosystem. The approach was to use global transcriptional profiling based on microarray technology to identify genes that were differentially expressed in four cultivars of soybeans with varying levels of quantitative resistance at different time points during infection by P. sojae. Our results provide a better understanding of the potential regulatory factors that may contribute to quantitative resistance during early hours of P. sojae infection.

  Filename       Size       Approximate Download Time (Hours:Minutes:Seconds) 
 28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access 
  Waller_LaChelleM_D_2010.pdf 697.62 Kb 00:03:13 00:01:39 00:01:27 00:00:43 00:00:03

Browse All Available ETDs by ( Author | Department )

dla home
etds imagebase journals news ereserve special collections
virgnia tech home contact dla university libraries

If you have questions or technical problems, please Contact DLA.