Title page for ETD etd-07242012-040138
|Type of Document
||Test generation for behavioral models with reconvergent fanout and feed-back
||Master of Science
|Armstrong, James R.
|Midkiff, Scott F.
|Tront, Joseph G.
|Date of Defense
In this thesis, new methods to handle reconvergent fanout and feed-back during behavioral
level test generation are proposed. These methods have been implemented -
into a previously developed automatic test generator. The improved test generator
was tested on five behavioral circuit models. For circuits with the reconvergent fanout
situation, the improved test generator can generate tests completely automatically.
For circuits with feed-back, user assistance in a circuit initialization step is required.
Some suggestions for future development for the test generator are discussed. Examples
on how to use the improved test generator are presented.
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